陽明交大電子吳添立 | 半導體教學 | WLab
@wlab4650
2025 L13: Electrostatic discharge (ESD) (2)
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4/5
2025 L12: Electrostatic discharge (ESD) (1)
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4/5
2025 L11: Mass Transport Induced Failures (2)
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4/5
2025 L10: Mass Transport Induced Failures (1)
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4/5
2025 L9: Time dependent dielectric breakdown (2)
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4/5
2025 L6: Mathematics of Failure-and-Reliability(2)
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4/5
![[2025 short course] 5-3: SiC MOSFETs Interface Challenges/PBTI/HTRB/Switching](https://i.ytimg.com/vi/fFHK9CpO614/maxresdefault.jpg)
![[2025 short course] 5-2: GaN BTI/TDDB/Switching/CGD/CGS & SiC TDDB](https://i.ytimg.com/vi/guedXDV6Ye8/maxresdefault.jpg)
![[2025 short course] 5-1: Wide bandgap GaN & SiC/ GaN OFF-state reliability](https://i.ytimg.com/vi/kvbVoPBfCtQ/maxresdefault.jpg)
![[2025 short course] 4-2: Hot Carrier Injection/ Charge Detection/ Bias Temperature Instability](https://i.ytimg.com/vi/yWt--ll3TV0/maxresdefault.jpg)