Advanced CMOS Scaling: FinFET to GAA and CFET | 2026 L14

Advanced CMOS Scaling: FinFET to GAA and CFET | 2026 L14

🎙 Prof. Tian-Li Wu 👥 11K 📅 June 3, 2026 ⏱ 75 min 👁 2K 📄 lecture 🧭 2026-08-16
Available in: English (current) Français

Keywords

CMOS scalingFinFETGate-All-AroundCFETshort-channel effects

Summary

This lecture by Prof. Tian-Li Wu at National Yang Ming Chiao Tung University (NYCU) provides a comprehensive overview of advanced CMOS scaling, focusing on the transition from planar MOSFETs to FinFETs, Gate-All-Around (GAA) nanosheet transistors, and Complementary FETs (CFET). The lecture begins by explaining the fundamental limitations of planar scaling, including short-channel effects, leakage current, and power density constraints. It then introduces the FinFET architecture, highlighting its improved electrostatic control and the historical milestones leading to its adoption by Intel in 2011. The discussion progresses to GAA nanosheet transistors, which offer even better electrostatic control by surrounding the channel on all four sides, and are now in production by Samsung and TSMC. Finally, the lecture touches on CFET, a future architecture that stacks n-type and p-type transistors vertically to further increase density. Throughout, the professor emphasizes key concepts such as subthreshold swing, body factor, and the 60 mV/decade limit, and discusses the challenges of continued scaling, including quantum effects and parasitic capacitance.

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Critical Evaluation

Value of the Information & Strength of the Argument

The lecture provides valuable and up-to-date information on the state-of-the-art in CMOS scaling, covering both fundamental physics and recent industry developments. The argumentation is solid, building from basic equations to explain why planar scaling fails and how multi-gate architectures address these issues. The professor clearly explains the trade-offs and challenges, such as the limitations of FinFET geometry and the benefits of GAA. The content is well-structured and logically presented, making it accessible to students with a background in semiconductor physics.

Scientific Rigor, Source Quality, Title Accuracy

The lecture demonstrates scientific rigor by grounding explanations in established physics and referencing real industry milestones (e.g., Intel’s 22nm tri-gate, Samsung’s 3nm GAA). The sources cited are primarily the course materials and the professor’s own knowledge, with no external references provided in the description. The title accurately reflects the content, which focuses on advanced CMOS scaling. The lecture is part of a university course, indicating a level of academic credibility.

165 words

Title / Content Match

The title accurately reflects the content, which covers the evolution from FinFET to GAA and CFET architectures.

Quality & Reliability

8/10

Lecture by a professor at a reputable university, covering established semiconductor physics and recent industry developments. The content is technically accurate and well-structured, though it is a lecture rather than peer-reviewed research.

Key Moments

Cited Sources

Concurring Sources

  • Intel 22nm Tri-Gate Technology — Intel's announcement of the first high-volume manufacturing of FinFET technology.
  • Samsung 3nm GAA — Samsung's announcement of the first production of GAA transistors.

Contribution & Novelties

This lecture provides a clear and structured explanation of the evolution from planar MOSFETs to advanced multi-gate architectures, synthesizing fundamental physics with recent industry developments. It offers valuable insights into the challenges and solutions for continued CMOS scaling.

Pour aller plus loin :

73 words

Radar Profile

The radar profile shows high scores across all dimensions, indicating a well-rounded and reliable educational resource. The lecture excels in providing both quantitative information and technical depth, with strong reliability and quality.

Reliability 8/10

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