DFT In Automotive

DFT In Automotive

by Semiconductor Engineering

Applied Sciences & Engineering Engineering & Technology TJFElectronics engineeringTJFCElectronics: circuits and components
🎙 Semiconductor Engineering 👥 30K 📅 May 13, 2026 ⏱ 13 min 👁 449 📄 expert opinion 🧭 2026-08-16
Available in: English (current) Français

Keywords

DFTautomotivefunctional safetyISO 26262security

Summary

In this interview, Lee Harrison, director of automotive IC solutions at Siemens EDA, discusses the application of design-for-test (DFT) in automotive semiconductors. He explains that while core DFT techniques remain similar, automotive requirements add layers of functional safety, quality, and security. Key technologies include logic built-in self-test (LBiST) and memory built-in self-test (MBiST), which are used to achieve high diagnostic coverage for single-point faults as mandated by ISO 26262. The concept of a ‘safety island’ is introduced as a dedicated area for managing in-system test. Harrison highlights the importance of periodic testing during operation, especially for safety-critical systems, and the role of DFT in enabling root cause analysis of field failures while maintaining security through techniques like root of trust. The discussion also covers the impact of regulations such as Europe’s Cyber Resilience Act (CRA) and ISO 21434, and the challenges of applying DFT to chiplets from multiple vendors, referencing IEEE 1838. The interview concludes with the emerging need for reliability monitoring and predictive maintenance, where AI could play a role.

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Critical Evaluation

Value of the Information & Strength of the Argument

The video provides valuable insights into how DFT is adapted for automotive, emphasizing the integration of safety and security. The argumentation is coherent, explaining the necessity of LBiST and MBiST for achieving high fault coverage and the trade-offs with area. The expert’s explanations are clear and logically structured, making a strong case for the importance of DFT in meeting automotive standards.

Scientific Rigor, Source Quality, Title Accuracy

The discussion is grounded in established industry standards (ISO 26262, ISO 21434, CRA, IEEE 1838) and reflects current practices. The title accurately represents the content. The video is produced by Semiconductor Engineering, a reputable trade publication, and the interviewee is a domain expert. However, the content is promotional for Siemens EDA, and no external sources are cited.

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Title / Content Match

The title accurately reflects the content, which focuses on DFT applications in automotive.

Quality & Reliability

8/10

The video features an expert from Siemens EDA discussing established DFT practices and standards (ISO 26262, ISO 21434, CRA) in automotive. The information is technically accurate and aligns with industry knowledge, though it is promotional in nature and lacks detailed technical depth.

Key Moments

Markers derived by PSI from the transcript: the creator did not define chapters.

Cited Sources

  • ISO 26262 — Mentioned as the functional safety standard for automotive.
  • ISO 21434 — Mentioned as the automotive security standard.
  • Cyber Resilience Act (CRA) — European regulation affecting connected devices.
  • IEEE 1838 — Standard for die-to-die connectivity in chiplets.

Concurring Sources

  • IEEE 1687 IJTAG — The video mentions IJTAG as the base for DFT, and this standard is the official reference.

Contribution & Novelties

The video provides a clear overview of how DFT is adapted for automotive, highlighting the integration of safety and security. It explains the role of LBiST and MBiST in achieving high diagnostic coverage and the concept of a safety island. The discussion on chiplets and the need for reliability monitoring adds forward-looking perspective.

Pour aller plus loin :

  • IEEE 1687 IJTAG — Standard for access and control of instrumentation embedded within a semiconductor device.
  • ISO 26262 — Road vehicles — Functional safety.
  • ISO 21434 — Road vehicles — Cybersecurity engineering.
  • Cyber Resilience Act — European Commission page on the CRA.

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Radar Profile

The radar profile shows high scores in quality and reliability, with moderate scores in quantity and technical depth. This indicates a focused, expert-led discussion that is trustworthy but not exhaustive.

Reliability 8/10